High Resolution Microscopy:
Optical and Scanning PROBE Tip Methods
2008 Course Description

• June 16, Monday morning
  Introduction to Light-Based Microscopy, Martin Scott (Rochester):
  The first class will be an introduction and overview of light-based microscopes. We begin with concepts and practical advice to equip a microscope user to select and adjust an instrument for repeatable and non-deceptive imaging. This session will be rich with information about the historical development of the microscope and the pioneers who enabled it.
  
  
• June 16, Monday afternoon
  Illumination in Microscopy, Prof. Thomas Brown/Dr. Douglas Goodman/Prof. Jim Zavislan:
  Demonstrations showing how much images of the same thing can vary with illumination. The degrees of freedom in illumination design. The description and measurement of illumination. Generalities about increasing the visibility of some features and reduce that of others. Limitations on illumination and how to build your own illumination systems.
  
  
• June 17, Tuesday morning
  Polarization, Phase Contrast, & Interference Microscopy, Prof. Jim Zavislan (Rochester):
  How the different methods work, both in transmission and reflection. What they are good and bad for. How to interpret the images produced. Various purposes of microscopic analysis, e.g. detection, measurement and both low power and high power microscopes.
  
  
• June 17, Tuesday afternoon
  Biomedical Microscopy, Prof. Edward Brown (Rochester):
  Overview of microscopic techniques for biological specimens. Discussion of epifluorescnce as well as confocal and multiphoton laser-scanning microscopy.
  
  
• June 18, Wednesday morning
  Scanning Probe Microscopy & Near-Field Optical Microscopy, Prof. Lukas Novotny/Mr. Bradley Deutsch (Rochester):
  Introduction to scanning probe microscopy with classroom hands-on demonstrations of scanning tunneling microscopy and atomic force microscopy. Outline of near-field optical techniques and their application for the characterization of photonic devices and measurement of local field distributions.