 Gary
W. Wicks
Associate Director and Professor
of Optics
Office: Wilmot 109A
Phone: (585) 275-4867
Fax: (585) 244-4936
E-mail: wicks@optics.rochester.edu
Short Biography
Gary W. Wicks received four degrees from the Applied and
Engineering Physics Department of Cornell University: B.S.
(1977), M.Eng. (1978), M.S. (1979) and Ph.D. (1981). He
remained at Cornell until 1987 as a research associate,
and later as a senior research associate, in the Electrical
Engineering Department. In 1987 he joined The Institute
of Optics faculty as an Associate Professor, and has held
the rank of Professor since 1993. In 2001, Professor Wicks
was appointed Associate Director of The Institute of Optics.
Research
Professor Wicks' research interests center around III-V
semiconductors: epitaxial growth, optical properties and
optical devices. Examples of his research include development
of new techniques in molecular beam epitaxial growth; reduced
dimensional structures such as quantum dots and superlattices;
studies of III-V heterostructure interfaces with Raman and
photoluminescence spectroscopies; and quantum dot lasers
and infrared detectors.
Research programs fall into
two areas, semiconductor materials and semiconductor devices.
In the materials area, examples of research include new
developments in the growth of semiconductor crystals by
molecular beam epitaxy, such as solid phosphorus sources
for phosphides, and selective area growth of nitrides. In
the device area, the research concentrates on arsenide and
phosphide lasers in the near IR and visible, InAs bipolar
transistors, and InAs/GaSb materials for mid-wave infrared
light emitters and detectors.
Professor Wicks' laboratory
features two molecular beam epitaxy systems, one for arsenides
/ phosphides / nitrides and one for antimonides / arsenides.
In addition, the lab has sample fabrication equipment, extensive
optical materials characterization (photoluminescence, Raman
spectroscopy, FTIR spectroscopy), electrical characterization
(Hall measurements, CV measurements), x-ray diffraction,
and electrical and optical device characterization.
Wicks
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